|
Symposium Presentations
November 29, 2006
8:30 - 8:45 Introduction and Scope, Leon Hamiter, Components Technology Institute, Inc.
8:45 - 9:15 Pacesetter Talk
Procurement Issues Leading to Counterfeit Components
Douglas McCormac, Retired, TRW Components International
9:15 - 10:30
Session 1: Counterfeits - Real World Issues
Chairman: Leon Hamiter, Components Technology Institute, Inc.
1.1 Experiences of a Contract Manufacturers with Counterfeits;
Thomas Lee, Jabil
1.2 Are Your Parts Really What you Think They Are?;
John Devaney, HiRel Labs
Break
10:45 - 12:00Session 2: Effective Detection Methods
Chairman: Gary Ewell, The Aerospace Corp.
2.1 Counterfeit Microelectronics - How to Authenticate Good from Bad;
Don Trenholm, Custom Analysis Labs
2.2 Mold Compound Identification to Assure Product Authenticity;
Bob Lowry, Electronic Materials Characterization
Lunch
1:30 - 5:15 Session 3: Testing & Analysis
Chairman: John Devaney, HiRel Labs
3.1 Electrical Testing Methods for Detecting Counterfeit Components;
Mark Marshall, Integra Technologies LLLC
3.2 Detection Methods and DPA Tools;
Thomas Lee, Jabil
Break
3.3 RoHs Compliance and Counterfeit Components;
Joel Deutsch, E-Certa
3.4 Inspection and Testing Program to Find Counterfeit Components;
Joseph Federico, NJ MET
3.5 Analysis to Identify Counterfeit Components ;
David Loaney, Premier Semiconductor Services
November 30, 2006
8:30 - 12:00 Session 4: Preventative Practices
Chairman: Thomas Lee, Jabil
4.1 Legal Considerations ;
Keith Gregory, Greenberg and Bass
4.2 Maxim's Approach to Combating Counterfeit ICs;
Felicia Rodericks, Maxim Intergrated Products
4.3 The TI Approach to Counterfeit ICs;
Joseph Sullivan, Texas Instruments Inc.
Break
4.4 Actions Promoted by IDEA to Prevent Delivery of Counterfeit Parts;
Debra Eggeman, IDEA
4.5 How Independent Distribution is Combating Counterfeit Components;
Mark Snider, ERAI
4.6 Discussion of Issues;
Lunch
1:30 - 4:30 Workshop
Moderators: John Devaney, Hi Rel Labs
Thomas Lee, Jabil
The Workshop will discuss the three primary supply chains used for component procurement, address
the risks of each and the progressive inspection and analysis techniques for use in finding
counterfeit parts.
Site Map
|
