Workshop Presentations

February 28, 2007

• 9:00 - 9:30

• Introduction and Overview of the Issues

  Leon Hamiter, Components Technology Institute, Inc.

• 9:30 - 12:00
• Session 1:
• Counterfeit Components - Experiences &
  Detection Equipment

• Chairman:
• Bob Lowry, EMC.

1.1 Experiences of a Contract Manufacturer with Counterfeits;
Thomas Lee, Jabil

1.2 Counterfeit Microelectronics - How to Authenticate Good from Bad;
Don Trenholm, Custom Analytical Services Inc.

1.3 XRF Instruments for WEEE/RoHs;
Paul Lomax, Fischer Technology

1.4 Handheld XRF Analyzers for Lead Plating and PEMs Materials;
Steve Mersal, Thermo Fisher Scientific/Eon Products

1.5 Table Top SEM Microscope;
Mike Boykin, Hitachi/Marine Reef

• 12:00 - 2:00
• Lunch & Equipment Demonstrations

• 1:30 - 5:15
• Session 2:
• Testing & Analysis

• Chairman:
• Leon Hamiter, CTI Inc.

2.1 Electrical Testing Methods for Detecting Counterfeit Components;
Mark Marshall, Integra Technologies LLLC

2.2 Detection Methods and DPA Tools;
Thomas Lee, Jabil

2.3 PEMs Packaging Materials Authenticity;
Bob Lowry, Electronic Materials Characterization

March 1, 2007

• 8:30 - 12:00
• Session 3:
• Preventative Practices

• Chairman:
• Thomas Lee, Jabil

3.1 U.S. Customs Service - Responsibilities & Legal Issues;
Jay Todras, Customs and Border Protection

3.2 U.S. Commercial Code & Legal Issues;
Laurence Pappas, ZD Integrated, Inc.

3.3 How Independent Distribution is Combatting Counterfeit Components;
Mark Snider, ERAI

3.4 IDEA Actions & Specifications;
Gary Heyes, IDEA Director

3.5 Discussion of Issues

• 12:00 - 2:00
• Lunch & Equipment Demonstrations

• 2:00 - 4:00
• Session 4:
• Procedures & Practices for Brokers & OEMs

• Moderators:
• Leon Hamiter, CTI Inc.
  Thomas Lee, Jabil