Semiconductor Technology Seminar - STS - An intensive course that addresses the needs of scientist, engineers, and technicians newly involved in design, development, testing, production, management, procurement or evaluation of semiconductors. The course will add to the knowledge and understanding of experienced technologists in modern semiconductor processes in sub-micron CMOS and BiCMOS. The impact of processing on yield and performance and reliability issues are emphasized by the course.

IC Failure Analysis for Yield Enhancement Seminar- ICFA - A comprehensive seminar which presents the latest techniques for analyzing wafer defects and IC failure mechanisms. The course discusses the means for correction of process defects to improve yields. Students will take away an understanding of how results of physical failure analysis can supplement statistical defect reduction efforts.

Passive Components Seminar - PCS - A seminar that covers design, construction, selection for the applications, failure mechanisms, testing, reliability, and lessons learned on ceramic; electrolytic film capacitors; carbon, film and wire wound resistors; and a select group of inductive devices. The seminar is based upon the CLR Passive Components Handbook by Fagerholt plus considerable additional material. Students will receive a copy of the CLR Handbook and slides presented.

Counterfeit Components Symposium - CCSW - This Symposium and Workshop addresses the problem being experienced with the many Counterfeit Components that are entering the electronics supply system. It will address practices for detection and prevention of using counterfeits. The Workshop session will develop specific engineering quality and purchasing practices for avoiding counterfeit components. Users and suppliers of components are encouraged to submit abstracts for presentations on this issue.

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